2020年12月
IEEE/IIAI AIT 2020
Outstanding Paper Award
Teruo Endo, Shigeaki Tanimoto, Motoi Iwashita, Toru Kobayashi, Hiroyuki Sato, Atsushi Kanai
“Risk Assessment Quantification for Bring Your Own Device”
2020年12月
IEEE/IIAI AIT 2020
Outstanding Paper Award
Teruo Endo, Shigeaki Tanimoto, Motoi Iwashita, Toru Kobayashi, Hiroyuki Sato, Atsushi Kanai
“Risk Assessment Quantification for Bring Your Own Device”