international

査読付き国際会議

Risk Assessment of BYOD: Bring Your Own Device

Proc.2016 IEEE 5th Global Conference on Electronics(GCCE),pp.511-514(2016.10)
Shigeaki Tanimoto, Susumu Yamada, Motoi Iwashita, Toru Kobayashi, Hiroyuki Sato, Atsushi Kanai